TeTechS, of Waterloo, Ontario, provider of advanced measurement systems, has developed the PlasThick multi-layer thickness measuring system for plastic containers. PlasThick is a fast and non-contact, ...
Ease-to-use, reliable thickness measurements with sub-micron accuracy for objects 12um to 50mm thick. Fairport, NY, USA: Saelig Company, Inc. (www.saelig.com) has announced the OptiGauge MLS™ – an ...
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The MicroSense UltraMap-200C is an automated wafer metrology system designed for high throughput measurement of wafer thickness, flatness, bow and warp. The system features a proprietary dual probe ...
The HyperGauge® in-plane film thickness meter achieves full-surface measurement of 300 mm wafers in just 5 seconds. HyperGauge In-plane Film Thickness Meter C17319-11 ©Hamamatsu Photonics Hamamatsu ...
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